• DocumentCode
    1487836
  • Title

    A Bayesian method for fitting parametric and nonparametric models to noisy data

  • Author

    Werman, Michael ; Keren, Daniel

  • Author_Institution
    Inst. of Comput. Sci., Hebrew Univ., Jerusalem, Israel
  • Volume
    23
  • Issue
    5
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    534
  • Abstract
    We present a simple paradigm for fitting models, parametric and nonparametric, to noisy data, which resolves some of the problems associated with classical MSE algorithms. This is done by considering each point on the model as a possible source for each data point. The paradigm can be used to solve problems which are ill-posed in the classical MSE approach, such as fitting a segment (as opposed to a line). It is shown to be nonbiased and to achieve excellent results for general curves, even in the presence of strong discontinuities. Results are shown for a number of fitting problems, including lines, circles, elliptic arcs, segments, rectangles, and general curves, contaminated by Gaussian and uniform noise
  • Keywords
    Bayes methods; Gaussian noise; estimation theory; mean square error methods; probability; Bayesian method; circles; elliptic arcs; general curves; lines; model fitting; noisy data; nonparametric models; parametric models; rectangles; segments; strong discontinuities; uniform noise; Bayesian methods; Curve fitting; Gaussian noise; Image segmentation; Linear approximation; Mean square error methods; Parametric statistics; Polynomials; Surface fitting; Traveling salesman problems;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.922710
  • Filename
    922710