DocumentCode
148793
Title
A built-in supply current test circuit for pin opens in assembled PCBs
Author
Umezu, Shoichi ; Hashizume, Masaki ; Yotsuyanagi, Hiroyuki
Author_Institution
Univ. of Tokushima, Tokushima, Japan
fYear
2014
fDate
23-25 April 2014
Firstpage
227
Lastpage
230
Abstract
In this paper, a built-in test circuit of electrical tests is proposed to detect pin opens of CMOS ICs. When a circuit is tested by the test method, current is made to flow through a targeted pin. An open defect is detected by means of the difference between the current of a defect-free circuit and the measured one. Feasibility of tests with the built-in supply current test circuit is examined by Spice simulation. It is shown that a pin open in a CMOS IC can be detected with the test circuit at a speed of 1MHz.
Keywords
CMOS integrated circuits; built-in self test; integrated circuit testing; printed circuit testing; CMOS ICs; Spice simulation; assembled PCBs; built-in supply current test circuit; defect-free circuit; electrical tests; frequency 1 MHz; open defect detection; pin detection; Integrated circuit interconnections; Integrated circuit modeling; Inverters; Logic gates; Pins; Soldering; assembled PCB test; biulit-in test circuit; electrical test; pin open; supply current testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging (ICEP), 2014 International Conference on
Conference_Location
Toyama
Print_ISBN
978-4-904090-10-7
Type
conf
DOI
10.1109/ICEP.2014.6826694
Filename
6826694
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