• DocumentCode
    1488139
  • Title

    Magnetization time decay in CrO2 tape

  • Author

    Tobin, V.M. ; Schultz, S. ; Chan, C.H. ; Oseroff, S.B.

  • Author_Institution
    Dept. of Phys., California Univ., San Diego, La Jolla, CA, USA
  • Volume
    24
  • Issue
    6
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2880
  • Lastpage
    2882
  • Abstract
    Measurements are reported of the bulk saturation magnetization, the coercive field, and the rate of magnetization decay per decade of time of IBM 3480 CrO2 tape over the temperature range 1.6 K <T<400 K. The extension of the data down to 1.6 K reveals that the decay rate extrapolates to zero as T approaches 0 K, with approximately a T1/2 dependence on temperature, as predicted by S.H. Charap´s (1988) model of thermal activation. A comparison of the data with the theory over the entire temperature range suggests that while the theory provides a qualitative framework for interpretation, a detailed evaluation of the model parameters will likely require appropriate extension to include realistic sample particle distributions of volume and orientation, as well as the relative contribution of shape and crystalline anisotropy
  • Keywords
    chromium compounds; ferromagnetic properties of substances; magnetic properties of fine particles; magnetic tapes; 1.6 to 400 K; CrO2 tape; IBM 3480 CrO2 tape; bulk saturation magnetization; coercive field; dependence on temperature; distribution of crystalline anisotropy; distribution of orientation; distribution of shape; distribution of volume; magnetisation time decay; model; particle distributions; rate of magnetization decay; temperature range; thermal activation; Anisotropic magnetoresistance; Data analysis; Magnetic analysis; Magnetic field measurement; Magnetization; Particle measurements; Temperature dependence; Temperature distribution; Temperature measurement; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92275
  • Filename
    92275