• DocumentCode
    1488292
  • Title

    Redundant-system demonstrated-reliability approximation using piece-part failure rates

  • Author

    Huang, Hsien-Lu

  • Author_Institution
    Rockwell Space Oper. Co., Houston, TX, USA
  • Volume
    40
  • Issue
    1
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    15
  • Lastpage
    19
  • Abstract
    A method of obtaining the reliability of a redundant system when only the part force-of-mortality estimates (hazard rates) for electronic parts are available is presented. Part failures are reported without specifying whether the parts are configured in series or in parallel. The sum of all the part failure rates in the system, recorded from the turn-on date of the system up to the present time of monitoring, and the sum of the failure rates of all the parts in the system recorded up to a certain previous time after the system turn-on date are calculated. The system reliability for a certain critical mission time, with or without redundancy, is calculated at that previous time. The method is useful in field-equipment reliability monitoring because exact computation is impossible without knowing whether the failed parts are configured in series or in parallel. Generally, Monte Carlo simulation should be used only to verify the results calculated through an analytic method, if such a method is available and is neither time consuming nor cost prohibitive. A dimensionless reliability parameter is introduced
  • Keywords
    electronic equipment testing; redundancy; reliability; Monte Carlo simulation; critical mission time; demonstrated-reliability approximation; dimensionless reliability parameter; electronic parts; field-equipment reliability monitoring; hazard rates; piece-part failure rates; redundant system; system reliability; Concurrent computing; Condition monitoring; Costs; Hardware; Hazards; Probability; Redundancy; Reliability; Statistical analysis; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.75326
  • Filename
    75326