• DocumentCode
    1488323
  • Title

    The effect of wiggler imperfections on nonlinear harmonic generation in free-electron lasers

  • Author

    Freund, Henry P. ; Biedron, Sandra G. ; Milton, Stephen V. ; Nuhn, Heinz-Dieter

  • Author_Institution
    Sci. Applications Int. Corp., McLean, VA, USA
  • Volume
    37
  • Issue
    6
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    790
  • Lastpage
    793
  • Abstract
    The generation of harmonics through a nonlinear mechanism driven by bunching at the fundamental has sparked interest in using this process as a path toward an X-ray free-electron laser (FEL). An important issue in this regard is the sensitivity of the nonlinear harmonic generation to wiggler imperfections. Typically, linear instabilities in FELs are characterized by increasing sensitivity to both electron beam and wiggler quality with increasing harmonic number. However, since the nonlinear harmonic generation mechanism is driven by the growth of the fundamental, the sensitivity of the nonlinear harmonic mechanism is not severely greater than that of the fundamental. In this paper, we study the effects of wiggler imperfections on the nonlinear harmonics in a 1.5-Å FEL, and show that the decline in the third harmonic emission with increasing levels of wiggler imperfections roughly tracks that of the fundamental
  • Keywords
    X-ray lasers; free electron lasers; optical harmonic generation; sensitivity; wigglers; 1.5 A; X-ray free-electron laser; electron beam; free-electron lasers; increasing harmonic number; linear instabilities; nonlinear harmonic generation; nonlinear mechanism; sensitivity; wiggler imperfections; wiggler quality; Electron beams; Free electron lasers; Frequency conversion; Laboratories; Light sources; Linear particle accelerator; Optical harmonic generation; Radio frequency; Undulators; X-ray lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.922776
  • Filename
    922776