Title :
Reliability prediction of solid dielectrics using electrical Noise as a screening parameter
Author :
Misra, Raj ; Pandey, Shyam ; Sundaresan, Vinu
Author_Institution :
New Jersey Inst. of Technol., Newark, NJ, USA
fDate :
4/1/1991 12:00:00 AM
Abstract :
The use of electrical noise for the screening of dielectric sheet material for reliability is studied. Results are presented which indicate that high-noise units have a greater failure rate compared to low-noise units when subjected to identical voltage and temperature stresses. Data for the various solid dielectric sheet materials and small transformers tested are presented
Keywords :
dielectric properties of solids; failure analysis; noise; reliability; dielectric sheet material; electrical Noise; failure rate; reliability prediction; screening parameter; small transformers; temperature stresses; voltage stresses; Capacitance; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Materials testing; Noise generators; Noise measurement; Sheet materials; Solids; Transformers;
Journal_Title :
Reliability, IEEE Transactions on
