DocumentCode :
1488426
Title :
Reliability prediction of solid dielectrics using electrical Noise as a screening parameter
Author :
Misra, Raj ; Pandey, Shyam ; Sundaresan, Vinu
Author_Institution :
New Jersey Inst. of Technol., Newark, NJ, USA
Volume :
40
Issue :
1
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
113
Lastpage :
116
Abstract :
The use of electrical noise for the screening of dielectric sheet material for reliability is studied. Results are presented which indicate that high-noise units have a greater failure rate compared to low-noise units when subjected to identical voltage and temperature stresses. Data for the various solid dielectric sheet materials and small transformers tested are presented
Keywords :
dielectric properties of solids; failure analysis; noise; reliability; dielectric sheet material; electrical Noise; failure rate; reliability prediction; screening parameter; small transformers; temperature stresses; voltage stresses; Capacitance; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Materials testing; Noise generators; Noise measurement; Sheet materials; Solids; Transformers;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.75346
Filename :
75346
Link To Document :
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