DocumentCode :
1488440
Title :
CVNS-Based Storage and Refreshing Scheme for a Multi-Valued Dynamic Memory
Author :
Khodabandehloo, Golnar ; Mirhassani, Mitra ; Ahmadi, Majid
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Windsor, Windsor, ON, Canada
Volume :
19
Issue :
8
fYear :
2011
Firstpage :
1517
Lastpage :
1521
Abstract :
Multi-valued dynamic memories are appropriate for applications such as implementation of neural networks, where massive number of synaptic weights have to be stored on a chip. In this paper, a novel storage and refreshing configuration to store up to 4 bits (16 levels) per cell on a dynamic memory is proposed. This configuration is based on the Continuous Valued Number System (CVNS). Error correction method according to the CVNS properties is used in order to increase the noise margin of memory cells. Furthermore, by decreasing the leakage current, the refresh cycle time is increased. The circuits are designed, simulated, and finally laid out using 90-nm CMOS technology.
Keywords :
CMOS memory circuits; circuit layout; circuit simulation; error correction; leakage currents; neural nets; storage management chips; CMOS technology; CVNS property; CVNS-based storage; circuit layout; circuit simulation; continuous valued number system; error correction method; leakage current; memory cells; multivalued dynamic memory; neural networks; noise margin; refresh cycle time; refreshing configuration; refreshing scheme; synaptic weights; CMOS memory circuits; CMOS technology; Circuit noise; Circuit simulation; Error correction; Error correction codes; Leakage current; Neural networks; Noise level; Random access memory; Continuous Valued Number System (CVNS); multi-valued memory; noise margin; refresh cycle time; storage cell;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2048588
Filename :
5463020
Link To Document :
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