• DocumentCode
    1488507
  • Title

    Enhanced Detection of Power-Quality Events Using Intra and Interscale Dependencies of Wavelet Coefficients

  • Author

    Dwivedi, U.D. ; Singh, S.N.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
  • Volume
    25
  • Issue
    1
  • fYear
    2010
  • Firstpage
    358
  • Lastpage
    366
  • Abstract
    Noise in power-quality (PQ) signals has been the biggest hurdle in wavelet-based detection and time localization of PQ events. The well-known threshold-based denoising techniques, used in the signal-processing area, do not perform well with practical PQ waveform data. This paper proposes a simple yet effective denoising technique using inter and intrascale dependencies of wavelet coefficients to denoise PQ waveform data for enhanced detection and time localization of PQ disturbances. Utilizing the fact that the wavelet coefficients are not only correlated with its local neighborhood within the subband but also across the subband, the proposed method exploits the local structure of wavelet coefficients as well as high correlation of adjacent wavelet scales. The effectiveness of the proposed approach is tested and demonstrated with both simulated and measured power-line disturbance data, and the results show that the proposed scheme significantly outperforms existing methods used to denoise PQ data.
  • Keywords
    power supply quality; signal denoising; time-frequency analysis; wavelet transforms; enhanced power-quality events detection; interscale dependencies; intrascale dependencies; multiresolution signal decomposition; power-line disturbance data; threshold-based denoising techniques; time localization; time-frequency analysis; wavelet coefficients; wavelet denoising; wavelet-based detection; Multiresolution signal decomposition (MSD); power-quality (PQ) assessment; time–frequency analysis; wavelet denoising;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2009.2027482
  • Filename
    5272138