• DocumentCode
    1488512
  • Title

    Using electrical bitmap results from embedded memory to enhance yield

  • Author

    Segal, Julie ; Jee, Alvin ; Lepejian, David ; Chu, Baptiste

  • Author_Institution
    HPL, San Jose, CA, USA
  • Volume
    18
  • Issue
    3
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    28
  • Lastpage
    39
  • Abstract
    Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis
  • Keywords
    failure analysis; integrated circuit testing; integrated memory circuits; bitmap results; electrical bitmap; embedded memory; failure analysis; yield; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Data analysis; Failure analysis; Logic circuits; Logic testing; Random access memory; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.922801
  • Filename
    922801
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1488512