DocumentCode
1488555
Title
Derivation of Reliability and Variance Estimates for Multi-State Systems With Binary-Capacitated Components
Author
Wang, Yong ; Li, Lin ; Huang, Shuhong
Author_Institution
Dept. of Mech. & Ind. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Volume
61
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
549
Lastpage
559
Abstract
This paper analytically derives the system reliability estimate, and the associated variance estimate for multi-state systems respectively using reliability, and variance estimates of binary-capacitated components. The derivation utilizes the universal generating function method to formulate a state table and a product expectation table when replacing two components with an equivalent virtual component. Closed-form expressions of the system reliability estimate and the associated variance estimate are formulated through an iterative derivation process. The derivation can be applied to multi-state systems with series-parallel configurations. Three example systems in the literature are used to illustrate the effectiveness and accuracy of the proposed analytical estimation approach. The confidence interval for the system reliability estimate is developed based on the derived results. The developed interval is then compared with another interval from the literature that approximated the variance estimate using a pseudo binomial distribution. Comparisons through Monte Carlo simulations on the example systems indicate that the coverage probabilities have been significantly improved by the interval constructed based on the proposed derivation.
Keywords
Monte Carlo methods; binomial distribution; iterative methods; reliability; Monte Carlo simulations; binary-capacitated components; closed-form expressions; coverage probabilities; iterative derivation process; multi-state systems; product expectation table; pseudo binomial distribution; series-parallel configurations; state table; system reliability estimate; universal generating function method; variance estimates; Closed-form solutions; Estimation; Monte Carlo methods; Probabilistic logic; Reliability theory; Uncertainty; Binary-capacitated component; multi-state system; reliability estimate; universal generating function; variance estimate;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2012.2192630
Filename
6179571
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