DocumentCode
1488567
Title
Reliability Analysis of
-out-of-
Systems With Single Cold Standby Using Pearson Distributions
Author
Van Gemund, Arjan J C ; Reijns, Gerard L.
Author_Institution
Fac. of Electr. Eng., Math., & Comput. Sci., Delft Univ. of Technol., Delft, Netherlands
Volume
61
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
526
Lastpage
532
Abstract
k-out-of-n systems with cold standby units are typically studied for unit lifetime distributions that allow analytical tractability. Often, however, these distributions differ significantly from reality. In this paper, we present an analytical approach to compute the mean failure time for k -out-of-n systems with a single cold standby unit for the wide class of lifetime distributions that can be captured by the Pearson distribution. The method requires the first four statistical moments of the unit´s lifetime distribution to be given, and computes the mean failure time using the Pearson distribution as an intermediate vehicle during the numerical integration. Experimental results for various instances of the Weibull distribution show that the numerical accuracy of the approach is high, with less than 0.5 percent error across a large range of k -out-of-n systems.
Keywords
Weibull distribution; redundancy; Pearson distributions; Weibull distribution; analytical tractability; cold standby units; k-out-of-n systems; mean failure time computation; numerical accuracy; numerical integration; reliability analysis; statistical analysis; unit lifetime distributions; Accuracy; Calculus; Computational modeling; Correlation; Reliability; Shape; Weibull distribution; Cold standby; Pearson approximation; failure time analysis; order statistics; redundant systems;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2012.2192587
Filename
6179573
Link To Document