DocumentCode :
148860
Title :
Solder crack simulation using SPH particle method with submodeling technique
Author :
Uchibori, Chihiro J. ; Sakuyama, Seiki ; Sakai, Yoshiki ; Thyon Su-I ; Watanabe, Toshio ; Yamagata, Nobuki
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fYear :
2014
fDate :
23-25 April 2014
Firstpage :
502
Lastpage :
506
Abstract :
In order to improve the mechanical reliability of IC packages crack generation and its propagation which are caused by such as Chip Package Interaction (CPI) are being investigated by various simulation methods. In this study, Smoothed-particle hydrodynamics (SPH) were first applied to analyze the crack propagation in a solder ball in a Flip Chip Ball Grid Array (FCBGA). SPH simulation is a meshless Lagrangian technique which is appealing as a possible alternative to techniques currently used to analyze complicated structures, fracture of materials and high deformation events. In this study, the SPH algorithm has been developed to elasto-plastic analysis and fracture analysis in the field of semiconductor structural dynamics. Then, heat conduction analysis and structural analysis using SPH theory were performed to analyze thermal stresses in FCBGA. Also sub-modeling approach was used to simulate crack propagation in solder balls which links the deformation from the package level to the solder ball level. The results show the crack initiation and crack propagation in solder balls clearly. SPH method is suite for computing fracture of solid materials because of the meshless algorithm and successfully applicable to crack propagation problems of semiconductors.
Keywords :
ball grid arrays; chip scale packaging; elastoplasticity; flip-chip devices; fracture; heat conduction; solders; surface cracks; thermal stress cracking; FCBGA; IC packages; SPH algorithm; SPH particle method; SPH theory; chip package interaction; crack generation; crack initiation; crack propagation; elasto-plastic analysis; flip chip ball grid array; fracture analysis; heat conduction analysis; mechanical reliability; meshless Lagrangian technique; meshless algorithm; semiconductor structural dynamics; smoothed-particle hydrodynamics; solder ball; solder crack simulation; structural analysis; submodeling technique; thermal stress; Equations; Finite element analysis; Packaging; Strain; Stress; Thermal analysis; Thermal stresses; Chip Packaging Interaction; Flip Chip Ball Grid Array; Particle method; SPH; crack propagation; sub-modeling; thermal stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging (ICEP), 2014 International Conference on
Conference_Location :
Toyama
Print_ISBN :
978-4-904090-10-7
Type :
conf
DOI :
10.1109/ICEP.2014.6826730
Filename :
6826730
Link To Document :
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