• DocumentCode
    148860
  • Title

    Solder crack simulation using SPH particle method with submodeling technique

  • Author

    Uchibori, Chihiro J. ; Sakuyama, Seiki ; Sakai, Yoshiki ; Thyon Su-I ; Watanabe, Toshio ; Yamagata, Nobuki

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    2014
  • fDate
    23-25 April 2014
  • Firstpage
    502
  • Lastpage
    506
  • Abstract
    In order to improve the mechanical reliability of IC packages crack generation and its propagation which are caused by such as Chip Package Interaction (CPI) are being investigated by various simulation methods. In this study, Smoothed-particle hydrodynamics (SPH) were first applied to analyze the crack propagation in a solder ball in a Flip Chip Ball Grid Array (FCBGA). SPH simulation is a meshless Lagrangian technique which is appealing as a possible alternative to techniques currently used to analyze complicated structures, fracture of materials and high deformation events. In this study, the SPH algorithm has been developed to elasto-plastic analysis and fracture analysis in the field of semiconductor structural dynamics. Then, heat conduction analysis and structural analysis using SPH theory were performed to analyze thermal stresses in FCBGA. Also sub-modeling approach was used to simulate crack propagation in solder balls which links the deformation from the package level to the solder ball level. The results show the crack initiation and crack propagation in solder balls clearly. SPH method is suite for computing fracture of solid materials because of the meshless algorithm and successfully applicable to crack propagation problems of semiconductors.
  • Keywords
    ball grid arrays; chip scale packaging; elastoplasticity; flip-chip devices; fracture; heat conduction; solders; surface cracks; thermal stress cracking; FCBGA; IC packages; SPH algorithm; SPH particle method; SPH theory; chip package interaction; crack generation; crack initiation; crack propagation; elasto-plastic analysis; flip chip ball grid array; fracture analysis; heat conduction analysis; mechanical reliability; meshless Lagrangian technique; meshless algorithm; semiconductor structural dynamics; smoothed-particle hydrodynamics; solder ball; solder crack simulation; structural analysis; submodeling technique; thermal stress; Equations; Finite element analysis; Packaging; Strain; Stress; Thermal analysis; Thermal stresses; Chip Packaging Interaction; Flip Chip Ball Grid Array; Particle method; SPH; crack propagation; sub-modeling; thermal stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging (ICEP), 2014 International Conference on
  • Conference_Location
    Toyama
  • Print_ISBN
    978-4-904090-10-7
  • Type

    conf

  • DOI
    10.1109/ICEP.2014.6826730
  • Filename
    6826730