DocumentCode
1488612
Title
Comparison of flicker noise in single layer, AMR and GMR sandwich magnetic film devices
Author
Wan, H. ; Bohlinger, M.M. ; Jenson, M. ; Hurst, A.
Author_Institution
Solid State Electron. Center, Honeywell Inc., Plymouth, MN, USA
Volume
33
Issue
5
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
3409
Lastpage
3411
Abstract
Flicker noise comparison has been made on single layer NiFeCo, Sandwich AMR NiFeCo/TaN/NiFeCo and GMR NiFeCo/CoFe/Cu/CoFe/NiFeCo films. In a single magnetic domain state, AMR films have noise close to the thermal noise, GMR has 2-3 times higher noise, and in a state having a useful MR ratio, the GMR film has 10 times higher noise than AMR sandwich film, while the sandwich film has 10 times higher noise than single layer AMR film
Keywords
flicker noise; giant magnetoresistance; magnetic anisotropy; magnetic multilayers; magnetoresistive devices; AMR; GMR; NiFeCo; NiFeCo-CoFe-Cu-CoFe-NiFeCo; NiFeCo-TaN-NiFeCo; flicker noise; sandwich magnetic film device; single layer magnetic film device; single magnetic domain state; thermal noise; 1f noise; Anisotropic magnetoresistance; Giant magnetoresistance; Magnetic domains; Magnetic fields; Magnetic films; Magnetic noise; Signal to noise ratio; Strips; Transfer functions;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.617960
Filename
617960
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