Title :
Effects of nonlinear diode junction capacitance on the nose-to-nose calibration
Author :
Remley, Kate A. ; Williams, Dylan F. ; DeGroot, Donald C. ; Verspecht, Jan ; Kerley, John
Author_Institution :
RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
5/1/2001 12:00:00 AM
Abstract :
We examine the effects of nonlinear diode junction capacitance on the fundamental premise of the nose-to-nose calibration, that the kickout pulse is identical in shape and duration to the impulse response of a sampling circuit. We offer a physical explanation for the error introduced by the nonlinear junction capacitance using small-signal diode equations.
Keywords :
SPICE; calibration; capacitance; cathode-ray oscilloscopes; microwave measurement; signal sampling; transient response; impulse response; kickout pulse; nonlinear diode junction capacitance; nonlinear junction capacitance; nose-to-nose calibration; sampling circuit; small-signal diode equations; Calibration; Capacitance; Diodes; Nonlinear equations; Oscilloscopes; Pulse circuits; Pulse shaping methods; Sampling methods; Shape; Voltage;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.923026
