Title :
Energy-transfer upconversion and thermal lensing in high-power end-pumped Nd:YLF laser crystals
Author :
Hardman, P.J. ; Clarkson, W.A. ; Friel, G.J. ; Pollnau, M. ; Hanna, D.C.
Author_Institution :
Optoelectron. Res. Centre, Southampton Univ., UK
fDate :
4/1/1999 12:00:00 AM
Abstract :
Thermal lensing in an end-pumped Nd:LiYF4 rod, under lasing and nonlasing conditions, has been investigated. Under lasing conditions, a weak thermal lens, with dioptric power varying linearly with pump power, was observed. Under nonlasing conditions, where higher inversion densities were involved, hence relevant to Q-switched operation or operation as an amplifier, a much stronger thermal lens was measured, whose power increased nonlinearly with pump power. This difference has been attributed to the increased heat deposition due to the subsequent multiphonon decay following various interionic upconversion processes, which increase strongly under nonlasing conditions, and is further exacerbated by the unfavorable temperature dependencies of heat conductivity and the rate of change of the refractive index with temperature. A strategy for reducing upconversion and its associated thermal loading, without degrading laser performance, is discussed
Keywords :
Q-switching; lithium compounds; neodymium; optical pumping; refractive index; solid lasers; thermal blooming; LiYF4:Nd; Nd:LiYF4 rod laser; Q-switched operation; YLF:Nd; dioptric power; energy-transfer upconversion; heat conductivity; heat deposition; high-power end-pumped Nd:YLF laser crystals; interionic upconversion processes; inversion densities; laser performance; lasing conditions; multiphonon decay; nonlasing conditions; pump power; refractive index; stronger thermal lens; thermal lensing; thermal loading; unfavorable temperature dependencies; weak thermal lens; Conductivity; Density measurement; High power amplifiers; Lenses; Operational amplifiers; Power measurement; Refractive index; Temperature dependence; Thermal lensing; Thermal loading;
Journal_Title :
Quantum Electronics, IEEE Journal of