Title :
-VBL replication error in Bloch line memory
Author :
Nakada, Satoshi ; Kohno, Minoru ; Watanabe, Kenjirou
Author_Institution :
Sony Corp., Tokyo, Japan
fDate :
11/1/1988 12:00:00 AM
Abstract :
Negative vertical Bloch line (-VBL) replication errors are analyzed, and the mechanism is clarified. The cause of these errors can be found in the relationship between the direction of magnetization in the domain wall and the distribution of the chopping magnetic field. Improvement in the distribution of chopping magnetic field to suppress or remove the cause of replication error is discussed
Keywords :
error analysis; magnetic bubble memories; magnetic domain walls; Bloch line memory; chopping magnetic field; domain wall; magnetisation direction; negative VBL replication errors; Conducting materials; Conductive films; Conductors; Garnet films; Magnetic analysis; Magnetic domain walls; Magnetic fields; Magnetic heads; Magnetization; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
