• DocumentCode
    1489380
  • Title

    Prognostics-Based Identification of the Top- k Units in a Fleet

  • Author

    Gebraeel, Nagi

  • Author_Institution
    Stewart Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    7
  • Issue
    1
  • fYear
    2010
  • Firstpage
    37
  • Lastpage
    48
  • Abstract
    This paper considers a fleet of identical units where each unit consists of the same critical components. The degradation state of each critical component is assumed to be monitored by an on-board sensor. The paper presents a methodology for identifying the top-k (the k most reliable) units in a fleet using sensor-based prognostic information. Specifically, we develop a prognostics-based ranking (PBR) algorithm that combines stochastic degradation models with computer science database ranking algorithms. The stochastic degradation modeling framework is used to compute and update, in real-time, residual life distributions (RLDs) of the critical components of each unit. Using a base case exponential degradation model, we identify conditions necessary to establish stochastic ordering among the RLDs of similar components. A preference relationship, consistent with the stochastic ordering results, is then used to sort the units of the fleet based on the RLDs of their respective components. A database ranking algorithm, known as the threshold algorithm (TA), is then used to identify the top-k units without necessarily computing all the RLDs. The paper concludes with an illustrative example.
  • Keywords
    reliability theory; state estimation; stochastic processes; computer science database ranking algorithm; critical components; exponential degradation model; on-board sensor; preference relationship; prognostics-based ranking algorithm; residual life distribution; sensor-based prognostic information; state degradation monitoring; stochastic degradation model; threshold algorithm; unit reliability; Condition monitoring; prognostics; residual life distributions; stochastic models;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2009.2023209
  • Filename
    5272424