Title :
High-Throughput On-Chip Large Deformation of Silicon Nanoribbons and Nanowires
Author :
Passi, Vikram ; Bhaskar, Umesh ; Pardoen, Thomas ; Södervall, Ulf ; Nilsson, Bengt ; Petersson, Göran ; Hagberg, Mats ; Raskin, Jean-Pierre
Author_Institution :
Inst. of Inf. & Commun. Technol., Electron. & Appl. Math., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
Abstract :
An on-chip internal stress-based testing device has been developed in order to deform silicon nanoribbons and nanowires up to large strains enabling high throughput of data. The fracture strain and survival probability distribution have been generated for 50-nm-thick and 50- or 500-nm-wide specimens with lengths varying between 2.5 and 10 . Fracture strains reaching up to 5% are attained in the smallest specimens, whereas 90% of the specimens survive 2.5% deformation. This testing platform opens an avenue to investigate and use electromechanical couplings appearing under large mechanical stress or large deformation.
Keywords :
deformation; elemental semiconductors; fracture; mechanical testing; nanoelectromechanical devices; nanofabrication; nanoribbons; nanowires; probability; silicon; stress-strain relations; NEMS; Si; electromechanical coupling; fracture strain; high-throughput on-chip large deformation; mechanical stress; nanoelectromechanical system; nanofabrication; nanoribbon; nanowire; on-chip internal stress-based testing device; size 10 mum; size 2.5 mum; size 50 nm; size 500 nm; survival probability distribution; Nanowires; Silicon; Silicon compounds; Strain; Testing; Wires; Fracture strain; Weibull statistics; nanoelectromechanical systems (NEMS); on-chip testing; silicon nanowires (Si NWs); tensile testing;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2012.2190711
