DocumentCode :
1489463
Title :
Testability design prevents harm
Author :
Ungar, Louis Y.
Author_Institution :
A.T.E. Solutions, Inc., Los Angeles, CA, USA
Volume :
25
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
35
Lastpage :
43
Abstract :
Design for Testability (DFT) has been accepted as a cost-saving approach in many applications. The rationale has been demonstrated in several papers by calculations showing how DFT benefits derived outweigh costs. In those cases, benefits dealt with cost savings in producing, testing, and deploying it product. Apparently, such benefits are bound by an upper limit as the savings could not be greater than the cost of making the product. Herein, however, we model the revenue generation capability of a product through its life-cycle and demonstrate that the impact on profits by poor quality products can be much greater. DFT can mitigate many of the causes for poor quality products. We provide examples of recent economic harm and disaster caused by defective electronics. For these examples, we postulate what DFT could have done to mitigate the defects and how much money the companies could have saved if DFT prevented the problems. Benefits derived from DFT in the product life-cycle combines with traditionally-demonstrated DFT benefits in production, making DFT even more compelling.
Keywords :
design for testability; electronic equipment testing; electronic products; investment; DFT investment; cost avoidance mechanism; defective electronics; design for testability; economic harm; electronic testing; product life cycle; product quality; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Electronic equipment testing; Integrated circuit testing; Manufacturing; System testing;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/MAES.2010.5463955
Filename :
5463955
Link To Document :
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