Experimental Study on Power Consumption in Lifetime Engineered Power Diodes

In this paper, we present a quantitative study of the effects of lifetime engineering treatments on the switching operation of power diodes, with special regards to the whole energy consumption. Not only single platinum diffusion and helium implantation processes, but also the combined effects for both treatments have been analyzed. Results show that care must be taken when choosing the lifetime treatment because univocal rules are difficult to draw.