Title :
Piezoelectric cantilever microphone and microspeaker
Author :
Lee, Seung S. ; Ried, Robert P. ; White, Richard M.
Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
fDate :
12/1/1996 12:00:00 AM
Abstract :
A micromachined piezoelectric cantilever transducer, which works both as a microphone and as a microspeaker, has been fabricated and tested. The 2000×2000×4.5 μm3 cantilever has a zinc oxide (ZnO) piezoelectric thin film on a supporting layer of low-pressure chemical-vapor-deposited (LPCVD) low-stress silicon nitride. A highlight of the fabrication process, which may also be relevant for other micromachined structures, is the technique for producing a flat, multilayer cantilever. The measured microphone sensitivity is fairly constant at 3 mV/μbar in the low frequency range and rises to 20 mV/μbar at the lowest resonant frequency of 890 Hz. The 3 mV/μbar sensitivity is the highest reported to date for a microphone with a micromachined diaphragm. When measured into a 2 cm3 coupler with 4 V(zero-peak) drive, the microspeaker output sound pressure level (SPL) is 75 dB at 890 Hz. It increases to approximately 100 dB SPL at 4.8 kHz with 6 V(zero-peak) drive. The measured microphone frequency response agrees well with the results of an ABAQUS simulation
Keywords :
acoustic transducers; frequency response; loudspeakers; micromachining; microphones; piezoelectric thin films; piezoelectric transducers; zinc compounds; 4 to 6 V; 890 Hz to 4.8 kHz; ABAQUS simulation; frequency response; micromachined diaphragm; micromachined structures; microphone; microspeaker; output sound pressure level; piezoelectric cantilever transducer; piezoelectric thin film; resonant frequency; Chemicals; Fabrication; Frequency measurement; Microphones; Nonhomogeneous media; Piezoelectric films; Piezoelectric transducers; Silicon; Testing; Zinc oxide;
Journal_Title :
Microelectromechanical Systems, Journal of