Title :
An Automatic Surface Elasticity Measurement and Error Compensation Method Based on Contact Mode AFM
Author :
Wei, Yangjie ; Dong, Zaili ; Wu, Chengdong
Author_Institution :
State Key Lab. of Robot., Shenyang Inst. of Autom., Shenyang, China
Abstract :
Force aroused from the contact of atomic force microscope (AFM) tip to a sample surface can induce compression of the sample due to its elasticity, thus causing the scanned height image of AFM to be lower than expected. A theoretical investigation of surface elasticity measurement and error compensation method is proposed in this paper. The error source of the height image is systematically demonstrated by analyzing the force curve of different materials in contact mode. Furthermore, an automatic surface elasticity measurement and error compensation method based on information fusion and parameter identification are proposed. In addition, Kalman filter is utilized to filter the compensated height image in order to eliminate system noise. Experimental results show the validity of the proposed compensation method and Kalman filter.
Keywords :
Kalman filters; atomic force microscopy; elastic moduli measurement; elasticity; error compensation; parameter estimation; Kalman filter; atomic force microscopy; automatic surface elasticity measurement; contact mode AFM; error compensation method; force curve; fusion; parameter identification; system noise; Atomic force microscopy; Error correction; Kalman filters; Measurement uncertainty; Noise measurement; Atomic force microscope (AFM); error compensation; information fusion; surface elasticity;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2011.2138715