Title :
Special Issue on Solid-State Image Sensors
Author :
Fossum, Eric R. ; Hynecek, J. ; Tower, J. ; Teranishi, N. ; Nakamura, Jun ; Magnan, Pierre ; Theuwissen, A.
Author_Institution :
Semicond. R&D Center, Samsung Electron. Co., Ltd., Yongin, South Korea
Abstract :
This editorial summarizes the contents of this special issue of the IEEE Transactions on Electron Devices on solid state image sensors. Several researches on CCD and CMOS image sensors are included in this issue.
Keywords :
CCD image sensors; CMOS image sensors; CCD image sensors; CMOS image sensors; solid-state image sensors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2009.2031900
