Title :
SEMPA domain observation compared to three other methods
Author :
Cameron, Graham P. ; Judy, Jack H.
Author_Institution :
Center for Magnetic & Inf. Technol., Minnesota Univ., Minneapolis, MN, USA
fDate :
11/1/1988 12:00:00 AM
Abstract :
SEMPA (scanning electron microscopy with polarization analysis) is compared to well-known methods of magnetic imaging, Bitter colloid, longitudinal magnetooptical Kerr effect (MOKE), and Lorentz transmission electron microscopy (LTEM), with no extraordinary image processing. Resolution is established by direct micrograph measurement of the smallest structure available. The images have been acquired using a thin-film (35-nm) Permalloy chevron-shaped object. Bitter images gave their usual delineation of domain walls. Longitudinal MOKE images produce results similar to Bitter images; however, diffraction patterns near the chevron´s boundary blurred the magnetic information. The LTEM micrographs provided by far the most qualitative data about the magnetization of the chevron; magnetization ripple structure was apparent. SEMPA images are produced with the highest magnification, 5000×, and the present generation of instrumentation did provide quantitative information about surface magnetization. However, the angle of magnetization in the plane of the film suffers from instrumental and electronic asymmetries. The magnitude of magnetization information appears to be consistent, even though it is uncalibrated
Keywords :
Kerr magneto-optical effect; Permalloy; ferromagnetic properties of substances; magnetic domains; magnetic surface phenomena; magnetic thin films; magnetisation; magneto-optical effects; scanning electron microscope examination of materials; transmission electron microscope examination of materials; Bitter colloid; Lorentz transmission electron microscopy; Permalloy thin film; SEMPA; angle of magnetization; chevron-shaped object; diffraction patterns; domain walls; longitudinal magnetooptical Kerr effect; magnetization ripple structure; scanning electron microscopy with polarization analysis; surface magnetization; Image analysis; Instruments; Magnetic analysis; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Magnetization; Polarization; Scanning electron microscopy; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on