Title :
Silicon piezoresistive stress sensors and their application in electronic packaging
Author :
Suhling, Jeffrey C. ; Jaeger, Richard C.
Author_Institution :
Aurban University
fDate :
6/1/2001 12:00:00 AM
Keywords :
Circuit testing; Electronic packaging thermal management; Electronics packaging; Integrated circuit packaging; Lead; Piezoresistance; Semiconductor device packaging; Silicon; Temperature sensors; Thermal stresses;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2001.923584