DocumentCode :
1490674
Title :
A 1.8-GHz 33-dBm P 0.1-dB CMOS T/R Switch Using Stacked FETs With Feed-Forward Capacitors in a Floated Well Structure
Author :
Ahn, Minsik ; Kim, Hyun-Woong ; Lee, Chang-Ho ; Laskar, Joy
Author_Institution :
Samsung RF Integrated Circuit (RFIC) Design Center, Atlanta, GA, USA
Volume :
57
Issue :
11
fYear :
2009
Firstpage :
2661
Lastpage :
2670
Abstract :
A 33-dBm P 0.1-dB single-pole double-throw antenna switch is designed and implemented using a standard 0.18-mum CMOS process at 1.8 GHz. An analysis shows a relation between parasitic junction capacitors and substrate resistance for low insertion loss (IL). The power-handling capability of the switch was also investigated through the voltage dividing mechanism through the substrate in the case of an ON-insertion loss-state NMOS switch implemented in a triple-well structure. A multistacked field-effect transistor (FET) structure with feed-forward capacitors in an Rx switch was chosen as the method of designing an antenna switch with high power-handling capability. Low IL of the switch in the multistacked FET structure is achieved by the optimization of layout and minimization of junction capacitors through the deep N-well bias. Allowance of a negative voltage swing at either the source or drain port is ensured by a floated well structure with a negatively biased P-well for each switch device of the multistacked FET structure. Intentional unequal division of the voltage swing level at each NMOS device by feed-forward capacitors with negative biases of the off-state switches helps to prevent channel formation in the off-state device. Experimental data shows that the proposed design achieves a 0.1-dB compression point at 33-dBm input power at 1.8 GHz with a negative bias supply to control the voltage at the off-state switches and the P -well of each device. The IL of the Tx switch is 0.5 and 0.73 dB at 900 MHz and 1.8 GHz, respectively. The Rx switch has 0.7- and 1.1-dB IL at 900 MHz and 1.8 GHz, respectively. In addition, a reliability issue related to antenna load mismatch was tested using a load-pull measurement setup.
Keywords :
CMOS integrated circuits; capacitor switching; field effect transistors; microwave switches; power semiconductor switches; semiconductor device reliability; CMOS T/R switch; FET; NMOS switch; feedforward capacitors; field-effect transistor; frequency 1.8 GHz; insertion loss; parasitic junction capacitors; reliability; 0.1-dB compression point; Feed-forward capacitor; floated well bias; high-power CMOS switch;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2009.2031928
Filename :
5276805
Link To Document :
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