DocumentCode :
1491016
Title :
Collection efficiency of photoelectrons injected into dense ar gas at low and intermediate temperatures
Author :
Borghesani, A.F. ; Lamp, P.
Author_Institution :
Dept. of Phys., Univ. of Padua, Padua, Italy
Volume :
19
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
689
Lastpage :
696
Abstract :
We measured the collection efficiency of electrons injected by means of photoelectric effect into argon gas at high density at temperatures T=177.3 K, above the critical temperature, and T=142.6 K, below it, for several densities as a function of the applied electric field. We show that the experimental data can be interpreted in terms of the Young-Bradbury model if we take into account the multiple scattering effects that affect the electron-atom scattering cross section.
Keywords :
argon; atom-electron collisions; photoelectricity; transport processes; Ar; Young-Bradbury model; applied electric field; electron-atom scattering cross section; intermediate temperature dense argon gas; low temperature dense argon gas; multiple scattering effects; photoelectric effect; photoelectron collection efficiency; temperature 142.6 K; temperature 177.3 K; Anodes; Argon; Cathodes; Electric fields; Scattering; Temperature measurement; Charge transport; dense noble gases; multiple scattering; scattering cross section;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2012.6180264
Filename :
6180264
Link To Document :
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