DocumentCode :
1491090
Title :
Estimating the posterior probability of LTP failure by sequential Bayesian analysis of an imperfect Bernoulli trial model
Author :
Bishop, William B.
Author_Institution :
Lockheed Martin Electron. & Surveillance Syst., Manijus, NY, USA
Volume :
48
Issue :
6
fYear :
2001
fDate :
6/1/2001 12:00:00 AM
Firstpage :
670
Lastpage :
683
Abstract :
A tetanically stimulated (TS) neuron is said to have failed to fire if its voltage-clamped excitatory postsynaptic current (EPSC) measurement is devoid of a long-term potentiation (LTP) response. This paper provides a method for evaluating the posterior probability of "failure" for TS neurons. A sequential Bayes algorithm is employed on an imperfect Bernoulli trial model to refine the posterior with each EPSC data record processed. The method is applied to both real and simulated LTP data and is shown to be consistent with the theoretical Beta-distributed posterior and the reported in vitro voltage-damped EPSC failure rates.
Keywords :
Bayes methods; bioelectric phenomena; cellular transport; neurophysiology; physiological models; probability; excitatory postsynaptic current; imperfect Bernoulli trial model; in vitro voltage-damped EPSC failure rates; long-term potentiation failure; nerve cells synaptic transmission; posterior probability estimation; sequential Bayes algorithm; sequential Bayesian analysis; theoretical Beta-distributed posterior; Bayesian methods; Current measurement; Damping; Failure analysis; Fires; In vitro; Neurons; Neurotransmitters; Statistical distributions; Voltage; Algorithms; Bayes Theorem; Biophysics; Excitatory Postsynaptic Potentials; Humans; Likelihood Functions; Long-Term Potentiation; Models, Neurological;
fLanguage :
English
Journal_Title :
Biomedical Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9294
Type :
jour
DOI :
10.1109/10.923785
Filename :
923785
Link To Document :
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