Measurement of hybrid-π equivalent circuit parameters of bipolar junction transistors in undergraduate laboratories

Author

Phang, C.H. ; Yeow, Y.T. ; Barham, R.A. ; Allen, P.J.

Author_Institution

Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia

Volume

40

Issue

3

fYear

1997

fDate

8/1/1997 12:00:00 AM

Firstpage

213

Lastpage

218

Abstract

In this paper we report on a simple and accurate technique for the measurement of the small-signal y-parameters of a bipolar transistor at a given DC bias using a standard LCR meter which is readily available in undergraduate electronics laboratories. We demonstrate how the hybrid-π equivalent circuit of the transistor can be extracted from the measurement using a spreadsheet. Practical results are presented and the accuracy of the extracted hybrid-π parameters is checked by comparison between PSPICE simulation and actual measurement of the frequency response of a common-emitter amplifier built with the transistor in question

Keywords

SPICE; bipolar transistors; circuit analysis computing; electronic engineering education; equivalent circuits; frequency response; student experiments; DC bias; PSPICE simulation; bipolar junction transistors; common-emitter amplifier; frequency response; hybrid-π equivalent circuit parameters; small-signal y-parameters; spreadsheet; standard LCR meter; undergraduate electronics laboratories; undergraduate laboratories; Bipolar transistor circuits; Circuit simulation; Electronic circuits; Equivalent circuits; Frequency measurement; Hybrid junctions; Laboratories; Microwave measurements; Physics; SPICE;

fLanguage

English

Journal_Title

Education, IEEE Transactions on

Publisher

ieee

ISSN

0018-9359

Type

jour

DOI

10.1109/13.618032

Filename

618032