• DocumentCode
    1491336
  • Title

    Numerical and experimental corroboration of an FDTD thin-slot model for slots near corners of shielding enclosures

  • Author

    Li, Min ; Ma, Kuang-Ping ; Hockanson, David M. ; Drewniak, James L. ; Hubing, Todd H. ; Van Doren, Thomas P.

  • Author_Institution
    Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
  • Volume
    39
  • Issue
    3
  • fYear
    1997
  • fDate
    8/1/1997 12:00:00 AM
  • Firstpage
    225
  • Lastpage
    232
  • Abstract
    Simple design maxims to restrict slot dimensions in enclosure designs below a half-wave length are not always adequate for minimizing electromagnetic interference (EMI). Complex interactions between cavity modes, sources, and slots can result in appreciable radiation through nonresonant length slots. The finite-difference time domain (FDTD) method can be employed to pursue these issues with adequate modeling of thin slots. Subcellular FDTD algorithms for modeling thin slots in conductors have previously been developed. One algorithm based on a quasistatic approximation has been shown to agree well with experimental results for thin slots in planes. This FDTD thin-slot algorithm is compared herein with two-dimensional (2-D) moment method results for thin slots near corners and plane wave excitation. FDTD simulations are also compared with measurements for slots near an edge of a cavity with an internal source
  • Keywords
    approximation theory; electromagnetic interference; electromagnetic shielding; finite difference time-domain analysis; interference suppression; method of moments; 2D moment method; EM radiation; FDTD simulations; FDTD thin slot algorithm; FDTD thin-slot model; cavity modes; conductor; corners; electromagnetic interference; enclosure designs; experimental results; finite-difference time domain; half-wave length; measurements; nonresonant length slots; plane wave excitation; quasistatic approximation; shielding enclosures; slot dimensions; sources; subcellular FDTD algorithms; two-dimensional moment method; Apertures; Capacitance; Coupling circuits; Dielectric constant; Electromagnetic interference; Electromagnetic modeling; Finite difference methods; Moment methods; Numerical models; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.618050
  • Filename
    618050