Title :
Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays
Author :
Allen, Gregory ; Edmonds, Larry D. ; Swift, Gary ; Carmichael, Carl ; Tseng, ChenWei ; Heldt, Kevin ; Anderson, Scott Arlo ; Coe, Michael
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilinx Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.
Keywords :
field programmable gate arrays; Xilinx Military/Aerospace grade FPGA; fault injection; field programmable gate arrays; mathematical model; multiple bit upset; single event test methodologies; size 90 nm; system error rate analysis; triple modular redundancy; Approximation methods; Error analysis; Field programmable gate arrays; Radiation detectors; Registers; Tunneling magnetoresistance; Error rate calculation; field programmable gate array; single event upset; triple modular redundancy;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2105282
