Title :
I&MS Fellows in 2009
fDate :
8/1/2009 12:00:00 AM
Abstract :
Presents the members of the Instrumentation and Measurement Society elevated to Fellow in 2009.
Keywords :
Digital signal processing; Digital-analog conversion; Electric variables measurement; Fellow Committee; Haptic interfaces; IEC standards; Metrology; Semiconductor device measurement; Societies; Ultrasonic variables measurement;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2009.5277936
