Title :
Enabling design and manufacturing through innovations in DFT
Abstract :
This issue of D&T includes five articles on various aspects of testing. The issue leads off with a tutorial on software-based self-testing of microprocessors, followed by four in-depth articles on aspects of test technology. This issue also features the second part of a Perspectives article on an NSF workshop. Columns include The Road Ahead, Book Reviews, and Conference Reports.
Keywords :
Automatic testing; Built-in self-test; Clocks; Costs; Design for testability; Manufacturing; Semiconductor device manufacture; Semiconductor device testing; Technological innovation; Timing; design and test; fault diagnosis; process methodology; self-testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.74
