DocumentCode
1491905
Title
Conference Reports
Author
Kapur, Rohit
Author_Institution
Synopsys
Volume
27
Issue
3
fYear
2010
Firstpage
75
Lastpage
75
Abstract
Conference Reports
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.64
Filename
5465127
Link To Document