• DocumentCode
    1491916
  • Title

    Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsystems
  • Volume
    27
  • Issue
    3
  • fYear
    2010
  • Firstpage
    80
  • Lastpage
    81
  • Abstract
    This is a review of New Methods of Concurrent Checking (by Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, and Daniel Marienfeld).
  • Keywords
    Aging; Books; Circuit faults; Circuit testing; Error correction; Error correction codes; Fault detection; Logic; Redundancy; System testing; concurrent checking; self-checking logic;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.63
  • Filename
    5465129
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1491916