Title :
Investigation of the Charge Collection Efficiency of CdMnTe Radiation Detectors
Author :
Rafiei, R. ; Boardman, D. ; Sarbutt, A. ; Prokopovich, D.A. ; Kim, K. ; Reinhard, M.I. ; Bolotnikov, A.E. ; James, R.B.
Author_Institution :
Australian Nucl. Sci. & Technol. Organ., Lucas Heights, NSW, Australia
fDate :
6/1/2012 12:00:00 AM
Abstract :
This paper presents the growth, fabrication and characterization of indium-doped cadmium manganese telluride (CdMnTe) crystals grown by the vertical Bridgman technique. The 10 × 10 × 1.9 mm3 samples have been fabricated, and the charge collection properties of the CdMnTe detectors have been measured. Alpha-particle spectroscopy measurements have yielded an average charge collection efficiency approaching 100%. Ion beam induced charge (IBIC) measurements have been performed by raster scanning focused 5.5 MeV 4He beams onto the detectors. Spatially resolved charge collection efficiency maps have been produced for a range of detector bias voltages. Inhomogeneities in the charge transport of the CdMnTe crystals have been associated with chains of Te inclusions within the detector bulk, and the reduction in charge collection efficiency in their locality has been quantified. It has been shown that the role of Te inclusions in degrading charge collection is reduced with increasing values of bias voltage. IBIC measurements for a range of low biases have highlighted the evolution of the charge collection uniformity across the detectors.
Keywords :
II-VI semiconductors; alpha-particle spectroscopy; cadmium compounds; crystal growth from melt; indium; ion beam effects; manganese compounds; semiconductor counters; semiconductor growth; wide band gap semiconductors; CdMnTe radiation detectors; CdMnTe:In; Te inclusions; alpha-particle spectroscopy measurements; average charge collection efficiency; charge collection uniformity; charge transport inhomogeneities; detector bias voltages; indium-doped cadmium manganese telluride crystals; ion beam induced charge measurements; raster scanning focused 4He beams; spatially resolved charge collection efficiency maps; vertical Bridgman technique; Conductivity; Crystals; Detectors; Manganese; Semiconductor device measurement; Surface treatment; Temperature measurement; Alpha particle spectroscopy; CMT; CdMnTe; IBIC; Te inclusions; charge collection efficiency; crystal growth; detector fabrication; mobility-lifetime; semiconductor radiation detector;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2190941