• DocumentCode
    1492531
  • Title

    Phase transitions in PbZrxHf1-xO3 determined by thermal analysis and impedance spectroscopy

  • Author

    De La Rubia, Miguel Angel ; Alonso, Roberto Emilio ; López-Garcia, Alberto R. ; De Frutos, J.

  • Author_Institution
    Dept. de Fis. Aplic. a las Tecnol. de la Informacion, ETSI Telecomun. (UPM), Madrid, Spain
  • Volume
    56
  • Issue
    9
  • fYear
    2009
  • fDate
    9/1/2009 12:00:00 AM
  • Firstpage
    1799
  • Lastpage
    1805
  • Abstract
    The objective of this study is to determine the influence of partial substitutions of Zr by Hf in the perovskite-type crystalline structure of PbZrO3. Different samples over the whole composition range (0 les x les 1) in the PbZrxHf1-xO3 family have been prepared. Phase transitions have been determined by thermal analysis (DSC) and complex impedance (IS) spectroscopy over a wide temperature range. As a consequence of the cation replacement, the changes that take place in the different phase transitions temperatures are reported. By both techniques, thermal analysis and electrical characterization, it is shown that for all compositions prepared there are 2 phase transitions in a temperature range between 160 and 230degC. With these results and the previously known crystalline structure of pure PbZrO3 and PbHfO3 perovskites, the phase diagram of the PbZrxHf1-xO3 family is presented for the first time.
  • Keywords
    crystal structure; differential scanning calorimetry; lead compounds; phase diagrams; solid-state phase transformations; thermal analysis; zirconium; DSC; PbZrxHf1-xO3; cation replacement; complex impedance spectroscopy; partial substitutions; perovskite-type crystalline structure; phase diagram; phase transitions; temperature 160 degC to 230 degC; thermal analysis; Crystallization; Electrochemical impedance spectroscopy; Hafnium; Temperature distribution; Zirconium;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2009.1252
  • Filename
    5278426