• DocumentCode
    1492552
  • Title

    A high temperature piezoelectric ceramic: (1-x)(Bi0.9La0.1)FeO3-xPbTiO3 crystalline solutions

  • Author

    Chen, Jianguo ; Qi, Yufa ; Shi, Guiyang ; Yu, Shengwen ; Cheng, Jinrong

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
  • Volume
    56
  • Issue
    9
  • fYear
    2009
  • fDate
    9/1/2009 12:00:00 AM
  • Firstpage
    1820
  • Lastpage
    1825
  • Abstract
    (1-x)(Bi0.9La0.1)FeO3-xPbTiO3 (BLF-PT) crystalline solutions for x = 0.35, 0.37, 0.4, 0.43 and 0.45 have been prepared by the solid-state reaction method. The X-ray diffraction analysis shows that BLF-PT has a single perovskite phase with mixed tetragonal and rhombohedral phases between x = 0.4 and 0.43. The Curie temperature of BLF-PT for x = 0.4 attains 460degC, which is about 80degC higher than that of hard Pb(Zr,Ti)O3 ceramics. The remnant polarization and piezoelectric constant of BLF-PT for x = 0.4 reach 38 muC/cm2 and 112 pC/N, respectively. The planar coupling factor kp of BLF-PT for x = 0.4 remains stable at temperature increases of up to 360degC. The impedance spectroscopy study reveals that the high temperature conduction of BLF-PT may be attributed to the motion of oxygen vacancies within the material. Our results indicate that BLF-PT is a promising candidate for high temperature applications.
  • Keywords
    X-ray diffraction; bismuth compounds; dielectric polarisation; ferroelectric Curie temperature; ferroelectric ceramics; lanthanum compounds; lead compounds; piezoceramics; piezoelectricity; vacancies (crystal); Bi0.9La0.1FeO3-PbTiO3; Curie temperature; X-ray diffraction; crystalline solutions; high temperature piezoelectric ceramics; impedance spectroscopy; oxygen vacancies; piezoelectric constant; planar coupling factor; remnant polarization; rhombohedral phase; single perovskite phase; solid-state reaction method; temperature 360 degC; tetragonal phase; Ceramics; Conducting materials; Crystallization; Electrochemical impedance spectroscopy; Piezoelectric polarization; Solid state circuits; Temperature; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2009.1255
  • Filename
    5278429