Title :
Effects of gallium on the structure and electrical properties of 0.65 Bi0.94La0.06) (GaxFe1-x)O3-0.35PbTiO3 ceramics
Author :
Qi, Yufa ; Chen, Jianguo ; Shi, Guiyang ; Yu, Shengwen ; Cheng, Jinrong
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
fDate :
9/1/2009 12:00:00 AM
Abstract :
Crystalline solutions of 0.65 (Bi0.94La0.06) (GaxFe1-x)O3-0.35PbTiO3 ceramics (BLGF-PT) for x = 0 and 0.05 have been fabricated by the solid-state reaction method. X-ray diffraction (XRD) was utilized to characterize the crystal structure and examine any possible impurities existing in the ceramics. The effects of Ga substitution on dielectric properties of the samples were studied at frequencies from 102 to 106 Hz over a temperature range from 20 to 620degC. The results indicate that Ga modification can reduce the room temperature dielectric loss. The conduction mechanism of the material was investigated using ac conductivity. It is concluded that electrons originating from Fe2+ and oxygen ion vacancies are the main charge carriers, and Ga doping could decrease the electronic conduction effectively. The frequency dependence of ac conductivity was found to follow Jonscher´s universal power law.
Keywords :
X-ray diffraction; bismuth compounds; crystal structure; dielectric losses; doping; electrical conductivity; gallium; lanthanum compounds; lead compounds; materials preparation; piezoceramics; solid solutions; vacancies (crystal); (Bi0.94La0.06)(GaxFe1-x)O3-PbTiO3; BLGF-PT ceramics; Jonscher´s universal power law; X-ray diffraction; XRD; ac conductivity; crystal structure; crystalline solutions; dielectric loss; doping; electrical properties; electronic conduction mechanism; frequency 100 Hz to 1000000 Hz; impurities; oxygen ion vacancies; piezoelectric materials; solid-state reaction method; temperature 20 C to 620 C; temperature 293 K to 298 K; Bismuth; Ceramics; Conductivity; Crystallization; Dielectric losses; Gallium; Iron; Solid state circuits; X-ray diffraction; X-ray scattering;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2009.1256