• DocumentCode
    1492776
  • Title

    Grain boundary Josephson devices by YBaCuO films and 77 K operations

  • Author

    Yamashita, T. ; Kawakami, A. ; Noge, S. ; Xu, W. ; Takata, M. ; Komatsu, T. ; Matusita, K.

  • Author_Institution
    Nagaoka Univ. of Technol., Japan
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    923
  • Lastpage
    926
  • Abstract
    Magnetron sputtering and screen printing methods were used to fabricate YBaCuO films with thicknesses of 5 to 30 μm. The annealing of the films at 1000°C gave abnormal grain growth. The grain size of the films was about 2 to 70 μm. With photolithography and razor cutting techniques, the films were formed into bridge-type Josephson junctions having a few grain boundaries in the bridge regions. In the devices, clear Shapiro steps and SQUID (superconducting quantum interference devices) patterns were observed at 77 K. The experiments showed that all currents flowing through grain boundaries are Josephson currents in YBaCuO polycrystalline films. Clear Josephson effects were observed in about 30% of the fabricated devices. Such devices may have high potential for high-frequency detectors and SQUID flux sensors operative at 77 K
  • Keywords
    Josephson effect; barium compounds; grain boundaries; high-temperature superconductors; superconducting junction devices; superconducting thin films; yttrium compounds; 5 to 30 micron; 77 K; SQUID flux sensors; SQUID patterns; Shapiro steps; YBaCuO films; annealing; bridge-type Josephson junctions; grain boundary Josephson devices; grain growth; grain size; high temperature superconductor; high-frequency detectors; magnetron sputtering; photolithography; razor cutting; screen printing; thicknesses; Grain boundaries; Josephson effect; Josephson junctions; Magnetic devices; Magnetic flux; SQUIDs; Superconducting devices; Superconducting films; Superconducting magnets; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92438
  • Filename
    92438