Title :
Switching noise in YBa2Cu3Ox `macrobridges´
Author :
Ono, R.H. ; Beall, J.A. ; Cromar, M.W. ; Mankiewich, P.M. ; Howard, R.E. ; Skocpol, W.
Author_Institution :
Nat. Bur. of Stand., Boulder, CO, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
Intermittent switching was observed in the voltage current characteristics of thin-film bridges of YBa2Cu3O x. At a fixed bias point there are multiple metastable voltage states with lifetimes which depend on the bias current and applied magnetic field. The microbridges are made of thin (<500 nm) polycrystalline films of YBa2Cu3Ox which are patterned by liftoff into structures with dimensions ranging from less than 1 μm. to 100 μm. Details of the fabrication process and the measurements are presented. The results are discussed in the context of fluctuations in the effective resistance of the bridge due to motion of trapped flux
Keywords :
barium compounds; electron device noise; high-temperature superconductors; superconducting junction devices; yttrium compounds; 1 to 100 micron; YBa2Cu3Ox; applied magnetic field; bias current; effective resistance; fabrication process; fixed bias point; high temperature superconductor; liftoff; multiple metastable voltage states; switching noise; thin-film bridges; trapped flux; voltage current characteristics; Bridge circuits; Fabrication; Magnetic fields; Magnetic noise; Magnetic switching; Metastasis; NIST; Temperature dependence; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
