Investigation of noise sources in SQUID electronics

Author

Clem, T.R. ; Goldstein, M.J. ; Purpura, J.W. ; Allen, L.H. ; Claassen, J.H. ; Gubser, D.U. ; Wolf, S.A.

Author_Institution

US Naval Coastal Syst. Center, Panama City, FL, USA

Volume

25

Issue

2

fYear

1989

fDate

3/1/1989 12:00:00 AM

Firstpage

1012

Lastpage

1017

Abstract

The performance of SQUID (superconducting quantum interference device)-based electronics may be degraded from that found in laboratory operation. Investigations on superconducting tubes, wires, and sheets have been conducted to identify contributions to such noise. Results have been obtained for bulk and thin-film samples utilizing both the conventional low-temperature materials and the new high temperature oxide materials. Experiments have been conducted to quantify flux redistribution and flux motion in superconducting samples subjected to temperature changes, temperature gradients, and magnetic field gradients. These investigations have been conducted for magnetic fields typical of many SQUID applications, with field intensities much smaller than the critical values H_c1. Penetration-depth, flux-pinning, and flux-motion effects have been observed. The various types of experiments conducted along with specific results are described

Keywords

SQUIDs; electron device noise; SQUID electronics; field intensities; flux motion; flux redistribution; flux-motion effects; flux-pinning; high temperature oxide materials; low-temperature materials; magnetic field gradients; noise sources; sheets; superconducting tubes; temperature changes; temperature gradients; wires; Conducting materials; High temperature superconductors; Magnetic fields; Magnetic materials; SQUIDs; Sheet materials; Superconducting device noise; Superconducting devices; Superconducting filaments and wires; Superconducting materials;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92460

Filename

92460