DocumentCode
1492969
Title
Interference faults testing for time switches
Author
Tyszer, Jerzy
Author_Institution
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
Volume
38
Issue
7
fYear
1990
fDate
7/1/1990 12:00:00 AM
Firstpage
954
Lastpage
958
Abstract
A detection scheme for coupling faults for integrated digital time-division switches is proposed. It is shown that a low overhead is necessary to improve fault detectability. Based on the proposed augmentation of a standard time switch, a new test procedure that possesses the following properties is developed: it guarantees a detection of all possible coupling faults in both data and control memory, and the number of tests is minimal
Keywords
electronic equipment testing; electronic switching systems; fault location; switching networks; time division multiplexing; control memory; coupling faults; data memory; detection scheme; fault detectability; integrated digital time-division switches; interference faults testing; Circuit faults; Communication switching; Communication system control; Coupling circuits; Fault detection; Interference; Phase change materials; Read-write memory; Switches; Testing;
fLanguage
English
Journal_Title
Communications, IEEE Transactions on
Publisher
ieee
ISSN
0090-6778
Type
jour
DOI
10.1109/26.57492
Filename
57492
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