• DocumentCode
    1493498
  • Title

    Rough set theory: a data mining tool for semiconductor manufacturing

  • Author

    Kusiak, Andrew

  • Author_Institution
    Dept. of Ind. Eng., Iowa Univ., Iowa City, IA, USA
  • Volume
    24
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    50
  • Abstract
    The growing volume of information poses interesting challenges and calls for tools that discover properties of data. Data mining has emerged as a discipline that contributes tools for data analysis, discovery of new knowledge, and autonomous decisionmaking. In this paper, the basic concepts of rough set theory and other aspects of data mining are introduced. The rough set theory offers a viable approach for extraction of decision rules from data sets. The extracted rules can be used for making predictions in the semiconductor industry and other applications. This contrasts other approaches such as regression analysis and neural networks where a single model is built. One of the goals of data mining is to extract meaningful knowledge. The power, generality, accuracy, and longevity of decision rules can be increased by the application of concepts from systems engineering and evolutionary computation introduced in this paper. A new rule-structuring algorithm is proposed. The concepts presented in the paper are illustrated with examples
  • Keywords
    data mining; evolutionary computation; integrated circuit manufacture; production engineering computing; rough set theory; autonomous decisionmaking; data analysis; data mining tool; decision rules; evolutionary computation; rough set theory; rule-structuring algorithm; semiconductor manufacturing; systems engineering; Data analysis; Data mining; Electronics industry; Evolutionary computation; Neural networks; Power engineering and energy; Power system modeling; Regression analysis; Set theory; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.924792
  • Filename
    924792