DocumentCode :
1493529
Title :
Characterization and Analysis of Relative Intensity Noise in Broadband Optical Sources for Optical Coherence Tomography
Author :
Shin, Sunghwan ; Sharma, Utkarsh ; Tu, Haohua ; Jung, Woonggyu ; Boppart, Stephen A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume :
22
Issue :
14
fYear :
2010
fDate :
7/15/2010 12:00:00 AM
Firstpage :
1057
Lastpage :
1059
Abstract :
Relative intensity noise (RIN) is one of the most significant factors limiting the sensitivity of an optical coherence tomography (OCT) system. The existing and prevalent theory being used for estimating RIN for various light sources in OCT is questionable, and cannot be applied uniformly for different types of sources. The origin of noise in various sources differs significantly, owing to the different physical nature of photon generation. In this study, we characterize and compare RIN of several OCT light sources including superluminescent diodes (SLDs), an erbium-doped fiber amplifier, multiplexed SLDs, and a continuous-wave laser. We also report a method for reduction of RIN by amplifying the SLD light output by using a gain-saturated semiconductor optical amplifier.
Keywords :
erbium; light sources; optical fibre amplifiers; optical tomography; superluminescent diodes; JkJk:Er; OCT light sources; SLD light output; broadband optical sources; continuous-wave laser; erbium-doped fiber amplifier; gain-saturated semiconductor optical amplifier; multiplexed SLDs; noise origin; optical coherence tomography; photon generation; relative intensity noise; superluminescent diodes; Optical coherence tomography (OCT); optical noise; semiconductor optical amplifiers (SOAs);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2050058
Filename :
5466150
Link To Document :
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