DocumentCode
1493546
Title
Modulation of the penetration depth of Nb and NbN films by quasiparticle injection
Author
Track, E.K. ; Radparvar, M. ; Faris, S.M.
Author_Institution
HYPRES Inc. Elmsford, NY, USA
Volume
25
Issue
2
fYear
1989
fDate
3/1/1989 12:00:00 AM
Firstpage
1096
Lastpage
1099
Abstract
A novel approach to modulating the inductance of a superconducting microstrip is described. This approach could be the basis for numerous practical applications, such as phase-shifters and high-frequency tuning elements. The physical mechanisms involved are quasiparticle injection, gap suppression, and penetration-depth modulation. The authors have investigated the modulation of the penetration depth of niobium and niobium nitride films by excess quasiparticle injection. To this effect, all niobium and all-niobium-nitride SQUID (superconducting quantum interference device) circuits were designed and fabricated. These circuits allow quasiparticle injection into the inductive element of the SQUID. This injection is achieved by optical irradiation through an opening in a Nb reflective layer which partially masks the rest of the circuit or electronic current injection through a tunnel junction overlaid on the microstrip inductance. Penetration-depth modulation is achieved with both methods. The magnitude of the effect varies from 10% to over 200% change in inductance
Keywords
SQUIDs; niobium; niobium compounds; penetration depth (superconductivity); strip line components; superconducting thin films; type II superconductors; Nb; NbN films; SQUID; gap suppression; high-frequency tuning elements; inductance modulation; optical irradiation; penetration-depth modulation; phase-shifters; quasiparticle injection; superconducting microstrip; superconducting quantum interference device; tunnel junction; Circuit optimization; Inductance; Interference; Microstrip; Niobium compounds; Optical films; SQUIDs; Superconducting devices; Superconducting epitaxial layers; Superconducting films;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.92480
Filename
92480
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