DocumentCode
1493681
Title
Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures
Author
Cundiff, Steven T. ; Bristow, Alan D. ; Siemens, Mark ; Li, Hebin ; Moody, Galan ; Karaiskaj, Denis ; Dai, Xingcan ; Zhang, Tianhao
Author_Institution
JILA, Univ. of Colorado, Boulder, CO, USA
Volume
18
Issue
1
fYear
2012
Firstpage
318
Lastpage
328
Abstract
Optical 2-D Fourier transform spectroscopy is a powerful technique for studying resonant light-matter interactions, determining the transition structure and monitoring dynamics of optically created excitations. The ability to separate homogeneous and inhomogeneous broadening is one important capability. In this paper, we discuss the use of this technique to study excitonic transitions in semiconductor nanostructures. In quantum wells, the effects of structural disorder is observed as inhomogeneous broadening of the exciton resonances. In quantum dots, the temperature dependence of the homogeneous width gives insight into the nature of the dephasing processes.
Keywords
Fourier transform spectra; Fourier transform spectroscopy; excitons; nanostructured materials; semiconductor quantum dots; semiconductor quantum wells; spectral line broadening; two-dimensional spectra; two-dimensional spectroscopy; excitonic transitions; homogeneous broadening; inhomogeneous broadening; optical 2-D Fourier transform spectroscopy; optically created excitations; resonant light-matter interactions; semiconductor nanostructures; structural disorder; Excitons; Gallium arsenide; Laser beams; Nonhomogeneous media; Shape; Silicon; Spectroscopy; Semiconductor nanostructures; spectroscopy; ultrafast optics;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2011.2123876
Filename
5749680
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