• DocumentCode
    1493681
  • Title

    Optical 2-D Fourier Transform Spectroscopy of Excitons in Semiconductor Nanostructures

  • Author

    Cundiff, Steven T. ; Bristow, Alan D. ; Siemens, Mark ; Li, Hebin ; Moody, Galan ; Karaiskaj, Denis ; Dai, Xingcan ; Zhang, Tianhao

  • Author_Institution
    JILA, Univ. of Colorado, Boulder, CO, USA
  • Volume
    18
  • Issue
    1
  • fYear
    2012
  • Firstpage
    318
  • Lastpage
    328
  • Abstract
    Optical 2-D Fourier transform spectroscopy is a powerful technique for studying resonant light-matter interactions, determining the transition structure and monitoring dynamics of optically created excitations. The ability to separate homogeneous and inhomogeneous broadening is one important capability. In this paper, we discuss the use of this technique to study excitonic transitions in semiconductor nanostructures. In quantum wells, the effects of structural disorder is observed as inhomogeneous broadening of the exciton resonances. In quantum dots, the temperature dependence of the homogeneous width gives insight into the nature of the dephasing processes.
  • Keywords
    Fourier transform spectra; Fourier transform spectroscopy; excitons; nanostructured materials; semiconductor quantum dots; semiconductor quantum wells; spectral line broadening; two-dimensional spectra; two-dimensional spectroscopy; excitonic transitions; homogeneous broadening; inhomogeneous broadening; optical 2-D Fourier transform spectroscopy; optically created excitations; resonant light-matter interactions; semiconductor nanostructures; structural disorder; Excitons; Gallium arsenide; Laser beams; Nonhomogeneous media; Shape; Silicon; Spectroscopy; Semiconductor nanostructures; spectroscopy; ultrafast optics;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2011.2123876
  • Filename
    5749680