Title :
Conjugated Polymer Films for Piezoresistive Stress Sensing
Author :
Zhong, G.Y. ; Zhang, Y.Q. ; Cao, X.A.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
Abstract :
The changes in the electrical conductivity of an indium-tin-oxide/poly [2-methoxy-5-(2´-ethylhexyloxy)-1,4-phyenylenevinylene] (MEH-PPV)/Al structure under compressive stresses were measured. The current recorded at 3 V showed a nearly linear characteristic response between 0.25 and 1.1 MPa with a sensitivity of 5.0 muA/KPa and a maximal piezoresistance coefficient of ~1.1 times 10-4 Pa-1. The devices under compression exhibited resistive switching above a threshold voltage with a resistance ratio of five, suggesting that the formation of nanofilamentary chains may be another mechanism in addition to increased intermolecular electron hopping contributing to the stress-induced current changes. The single-layer MEH-PPV sensors also exemplified good stability and repeatability, and appear to be promising for tactile sensing applications.
Keywords :
MIS devices; aluminium; conducting polymers; electrical conductivity; hopping conduction; indium compounds; nonelectric sensing devices; organic semiconductors; piezoresistance; piezoresistive devices; polymer films; stress measurement; tactile sensors; tin compounds; Al; ITO; compressive stresses; conjugated polymer films; electrical conductivity; indium-tin-oxide; intermolecular electron hopping; piezoresistance coefficient; piezoresistive stress sensing; poly [2-methoxy-5-(2´-ethylhexyloxy)-1,4-phyenylenevinylene]; resistance ratio; resistive switching; single-layer MEH-PPV sensors; stress-induced current changes; tactile sensing; threshold voltage; Conjugated polymer; piezoresistance; stress sensor;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2009.2031255