DocumentCode
1493923
Title
A 455-Mb/s MR preamplifier design in a 0.8-μm CMOS process
Author
Harjani, Ramesh
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
Volume
36
Issue
6
fYear
2001
fDate
6/1/2001 12:00:00 AM
Firstpage
862
Lastpage
872
Abstract
In this paper, we present a CMOS preamplifier for use with magnetoresistive (MR) read elements in disk drives. The performance of the CMOS design is competitive with the more expensive current generation of BiCMOS MR preamplifiers. The measured gain for the preamplifier is 43 dB and the measured 3-dB bandwidth is greater than 273 MHz corresponding to a 455-Mb/s data rate. Likewise, the measured input-referred voltage noise is less than 0.57 nV/√Hz, and measured input-referred current noise is less than 10.54 pA/√Hz at an MR bias current of 10 mA, The preamplifier has been implemented in a 0.8-μm 5 V CMOS process and occupies a die area of 1.78×1.78 mm 2 In this paper, we introduce a new scheme to reduce current noise below that contributed by a single MOS device, This technique has the potential for even more impact for future submicron processes. We also showed that voltage amplifiers offer lower noise than transimpedance amplifiers for similar gain and bandwidth constraints
Keywords
CMOS analogue integrated circuits; disc drives; integrated circuit noise; magnetic heads; magnetoresistive devices; preamplifiers; 0.8 micron; 273 MHz; 3-dB bandwidth; 43 dB; 455 Mbit/s; 5 V; CMOS process; MR preamplifier design; bandwidth constraints; bias current; die area; disk drives; input-referred current noise; input-referred voltage noise; read elements; submicron processes; transimpedance amplifiers; Area measurement; Bandwidth; CMOS process; Current measurement; Gain measurement; Low-noise amplifiers; Noise measurement; Noise reduction; Preamplifiers; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.924849
Filename
924849
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