• DocumentCode
    1493923
  • Title

    A 455-Mb/s MR preamplifier design in a 0.8-μm CMOS process

  • Author

    Harjani, Ramesh

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    36
  • Issue
    6
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    862
  • Lastpage
    872
  • Abstract
    In this paper, we present a CMOS preamplifier for use with magnetoresistive (MR) read elements in disk drives. The performance of the CMOS design is competitive with the more expensive current generation of BiCMOS MR preamplifiers. The measured gain for the preamplifier is 43 dB and the measured 3-dB bandwidth is greater than 273 MHz corresponding to a 455-Mb/s data rate. Likewise, the measured input-referred voltage noise is less than 0.57 nV/√Hz, and measured input-referred current noise is less than 10.54 pA/√Hz at an MR bias current of 10 mA, The preamplifier has been implemented in a 0.8-μm 5 V CMOS process and occupies a die area of 1.78×1.78 mm 2 In this paper, we introduce a new scheme to reduce current noise below that contributed by a single MOS device, This technique has the potential for even more impact for future submicron processes. We also showed that voltage amplifiers offer lower noise than transimpedance amplifiers for similar gain and bandwidth constraints
  • Keywords
    CMOS analogue integrated circuits; disc drives; integrated circuit noise; magnetic heads; magnetoresistive devices; preamplifiers; 0.8 micron; 273 MHz; 3-dB bandwidth; 43 dB; 455 Mbit/s; 5 V; CMOS process; MR preamplifier design; bandwidth constraints; bias current; die area; disk drives; input-referred current noise; input-referred voltage noise; read elements; submicron processes; transimpedance amplifiers; Area measurement; Bandwidth; CMOS process; Current measurement; Gain measurement; Low-noise amplifiers; Noise measurement; Noise reduction; Preamplifiers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.924849
  • Filename
    924849