DocumentCode :
1494428
Title :
Picosecond magnetic spectroscopy with integrated DC SQUIDs
Author :
Awschalom, D.D. ; Warnock, J.
Author_Institution :
IBM T.J. Waston Res. Center, Yorktown Heights, NY, USA
Volume :
25
Issue :
2
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
1186
Lastpage :
1192
Abstract :
Advanced VLSI (very large scale integration) technology was used to fabricate ultraminiature integrated SQUID (superconducting quantum interference device) susceptometers. With the appropriate design parameters, the sensitivity of the devices approaches the quantum limit. The use of integrated circuits in conjunction with pulsed optical techniques allows magnetic systems to be probed with a picosecond time resolution. The response can be mapped out as a function of the energy of the optical excitation, providing detailed spectroscopic information. Applying these techniques to the study of II-VI dilute magnetic semiconductors has yielded new insight into the mechanics of magnetic polaron formation and the dynamics of the magnetic spins. First experiments were carried out on a small ~10×10×1-μm3 single crystal platelet of Cd0.8Mn0.2Te. The results of the time-averaged magnetic spectroscopy at two different temperatures are presented, displaying the magnetic response to optical excitation at constant intensity from a photon energy of 1.83 to 2.0 eV
Keywords :
SQUIDs; VLSI; cadmium compounds; magneto-optical effects; manganese compounds; polarons; semimagnetic semiconductors; 1.83 to 2.0 eV; Cd0.8Mn0.2Te; II-VI dilute magnetic semiconductors; VLSI; constant intensity; integrated DC SQUIDs; magnetic polaron formation; magnetic spins; pulsed optical techniques; susceptometers; time-averaged magnetic spectroscopy; ultraminiature integrated SQUID; Integrated circuit technology; Magnetic semiconductors; Optical sensors; Photonic crystals; SQUIDs; Spectroscopy; Superconducting devices; Superconducting integrated circuits; Superconducting magnets; Very large scale integration;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92502
Filename :
92502
Link To Document :
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